Equipment


	DualBeam FEI Scios REM-FIB for 3-dim. Investigations EDAX-Analysis with EDX, WDX and EBSD for chemical analysis and crystallography in-situ stress-strain up to 5 kN in-situ heating up to 1000 °C

	Scanning electron microscope FEI XL30 FEG-cathode SEM EDAX-Analysis with EDX, WDX and EBSD for chemical analysis and crystallography

	Focused Ion Beam FEI Strata Ga-Ion beam for cross section and TEM-sample preparation

	Scanning electron microscope Zeiss EVO 15 Scanning electron microscope with EDX for material characterization

	Laboratory for material analysis Development and improvement of microscopic and material analysis techniques New x-ray sources for X-ray fluorescence spectroscopy (XFS) X-ray diffraction and spectroscopy