Equipment

DualBeam FEI Scios

• REM-FIB for 3-dim. Investigations
• EDAX-Analysis with EDX, WDX and EBSD for chemical analysis and crystallography
• in-situ stress-strain up to 5 kN
• in-situ heating up to 1000 °C

Scanning electron microscope FEI XL30

• FEG-cathode SEM
• EDAX-Analysis with EDX, WDX and EBSD for chemical analysis and crystallography

Focused Ion Beam FEI Strata

• Ga-Ion beam for cross section and TEM-sample preparation

Scanning electron microscope Zeiss EVO 15

• Scanning electron microscope with EDX for material characterization

Laboratory for material analysis

• Development and improvement of microscopic and material analysis techniques
• New x-ray sources for X-ray fluorescence spectroscopy  (XFS)
• X-ray diffraction and spectroscopy